electron bombardment ion source

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• Ion source — An ion source is an electro magnetic device that is used to create charged particles. These are used primarily within mass spectrometers or particle accelerators.Mass spectrometry In mass spectrometry, an ion source is a piece of equipment used… …   Wikipedia

• Ion — Cation and Anion redirect here. For the particle physics/quantum computing concept, see Anyon. For other uses, see Ion (disambiguation). Hydrogen atom (center) contains a single proton and a single electron. Removal of the electron gives a cation …   Wikipedia

• electron tube — an electronic device that consists, typically, of a sealed glass bulb containing two or more electrodes: used to generate, amplify, and rectify electric oscillations and alternating currents. Also called electronic tube. Cf. gas tube, vacuum tube …   Universalium

• Electron gun — An electron gun (also called electron emitter) is an electrical component that produces an electron beam that has a precise kinetic energy and is most often used in televisions and monitors which use cathode ray tube technology, as well as in… …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Electron beam physical vapor deposition — or EBPVD is a form of physical vapor deposition in which a target anode is bombarded with an electron beam given off by a charged tungsten filament under high vacuum. The electron beam causes atoms from the target to transform into the gaseous… …   Wikipedia

• Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …   Wikipedia

• Fast atom bombardment — Infobox chemical analysis name = Fast atom bombardment mass spectrometry caption =ThermoQuest AvantGarde MS with quadropule detector and FAB/EI source. acronym = FAB classification =Mass spectrometry analytes = manufacturers = related = Secondary …   Wikipedia

• mass spectrometry — or mass spectroscopy Analytic technique by which chemical substances are identified by sorting gaseous ions by mass using electric and magnetic fields. A mass spectrometer uses electrical means to detect the sorted ions, while a mass spectrograph …   Universalium

• Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… …   Wikipedia

• Helium atom scattering — (HAS) is a surface analysis technique used in materials science. HAS provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.… …   Wikipedia